As too many redundant events included in crash test sequences generated by Android automated test tools may result in test replay, defect comprehension, and repairing difficulty, a great number of test sequence reduction works have been proposed. While current works only focus on the application interface changes and ignore the internal state changes during program execution. Moreover, current works only model application states at a single and abstract granularity, such as control widget granularity or activity granularity, resulting in long test sequences after reduction or inefficient reduction. This study proposes an Android test sequence reduction method combined with multi-granularity based on event labeling. By taking into account the Android lifecycle management mechanism and data flow analysis to label critical events that trigger crashes, this method can narrow the sequence reduction space and design a strategy of rough selection under low granularity and detailed reduction under high granularity. At last, a crash test sequence set containing complex scenarios such as inter-application interaction and user input is collected, and the comparison with other test sequence reduction works on this set verifies the effectiveness of the method proposed in this study.