微信服务号

微信订阅号

2025-4-6- 1
Home > Archive>Volume 21, Issue 3, 2010 >539-547
PDF HTML XML Export Cite reminder
Approach of Degenerate Test Set Generation Based on Secure State Transition
Author:
Affiliation:

  • Article
    • | |
  • Metrics
    • |
  • Reference [19]
    • |
  • Related [20]
    • |
  • Cited by [1]
    • | |
  • Comments
    Abstract:

    Based on predecessors’ work, this propose the concept of degenerate test set (DTS) and an approach that performs test generation and redundancy elimination in the light of the special requirement of verification of the secure operating system. This approach is secure state transition-based for the first time and can generate an efficient test set by reducing the redundant system state transitions and similar properties with model checkers in the test case generation. Furthermore, it discusses the validity of the DTS when only some cases of the set fail and improve the DTS generation algorithm. The experiments prove that this approach can reduce the size of test set efficiently.

    Reference
    [1] Wimmel G, Jürjens J. Specification-Based test generation for security-critical systems using mutations. In: Proc. of the 4th Int’l Conf. on Formal Engineering Methods: Formal Methods and Software Engineering. London: Springer-Verlag, 2002. 471?482.
    [2] Liu L, Miao HK. A framework for specification-based class testing. In: Proc. of the 8th IEEE Int’l Conf. on Engineering of Complex Computer Systems (ICECCS 2002). Washington: IEEE Computer Society Press, 2002. 153?162.
    [3] Rusu V, du Bousquet L, Jeron T. An approach to symbolic test generation. In: Proc. of the Int’l Conf. on Integrating Formal Methods, LNCS 1945. Dagstuhl: Springer-Verlag, 2000. 338?357.
    [4] Offutt AJ, Liu S, Abdurazik A, Ammann P. Generating test data from state-based specifications. Software Testing, Verification & Reliability, 2003,13(1):25?53.
    [5] Huth M, Ryan M. Logic in Computer Science: Modeling and Reasoning about Systems. London: Cambridge University Press,2004.
    [6] McMillan KL. Symbolic model checking [Ph.D. Thesis]. Pittsburgh: Carnegie Mellon University, 1992.
    [7] Holzmann GJ. The model checker SPIN. IEEE Trans. on Software Engineering, 1997,23(5):279?295.
    [8] Heimdahl MPE, Rayadurgam S, Visser W, Devaraj G, Gao J. Auto-Generating test sequences using model checkers: A case study.In: Proc. of the 3rd Int’l Workshop on Formal Approaches to Testing of Software (FATES 2003). Montreal: Spinger-Verlag, 2003.42?59.
    [9] Beyer D, Chlipala AJ, Henzinger TA, Jhala R, Majumdar R. Generating tests from counterexamples. In Proc. of the 26th Int’l Conf.on Software Engineering (ICSE 2004). Los Alamitos: IEEE Computer Society Press, 2004. 326?335.
    [10] Hamon G, Moura L, Rushby J. Generating efficient test sets with a model checker. In: Proc. of the 2nd Int’l Conf. on Software Engineering and Formal Methods (SEFM). Beijing: IEEE Computer Society Press, 2004. 261?270.
    [11] Offutt J, Xiong Y, Liu S. Criteria for generating specification-based tests. In: Proc. of the 1st IEEE Conf. on Engineering of Complex Computer Systems. Las Vegas: IEEE Computer Society Press, 1999. 119?129.
    [12] Jeffrey D, Gupta N. Test suite reduction with selective redundancy. In: Proc. of the 21st IEEE Int’l Conf. on Software Maintenance(ICSM 2005). Budapest: IEEE Computer Society, 2005. 549?558.
    [13] Zeng HW, Miao HK, Liu J. Specification-based test generation and optimization using model checking. In: Proc. of the 1st Joint IEEE/IFIP Symp. on Theoretical Aspects of Software Engineering. Shanghai: IEEE Computer Society, 2007. 349?355.
    [14] Chen H, Dean D, Wagner D. Model checking one million lines of C code. In: Proc. of the 11th Annual Network and Distributed System Security Symp. 2004. 171?185. http://www.cs.ucdavis.edu/～hchen/paper/ndss09.pdf
    [15] Nie CH, Xu BW. A minimal test suite generation method. Chinese Journal of Computers, 2003,26(12):1690?1695 (in Chinese with English abstract).
    [16] Hong HS, Cha SD, Lee I, Sokolsky O, Ural H. Data flow testing as model checking. In: Proc. of the 25th Int’l Conf. on Software Engineering. IEEE Computer Society Press, 2003. 232?242.
    [17] Zhang XF, Xu BW, Nie CH, Shi L. An approach for optimizing test suite based on testing requirement reduction. Journal of Software, 2007,18(4):821?831 (in Chinese with English abstract). http://www.jos.org.cn/1000-9825/18/821.htm
    附中文参考文献: [15] 聂长海, 徐宝文.一种最小测试集生成方法.计算机学报,2003,26(12):1690?1695.
    [17] 章晓芳,徐宝文,聂长海,史亮.一种基于测试需求约简的测试集优化方法.软件学报,2007,18(4):821?831. http://www.jos.org.cn/1000-9825/18/821.htm
    Comments
    Comments
    分享到微博
    Submit
Get Citation

程亮,张阳,冯登国.一种基于安全状态转移的简并测试集生成方法.软件学报,2010,21(3):539-547

Copy
Share
Article Metrics
  • Abstract:5271
  • PDF: 6840
  • HTML: 0
  • Cited by: 0
History
  • Received:December 06,2007
  • Revised:May 06,2008
Links:Institute of Software, CASChina Computer FederationCASNSFC
You are the first2033259Visitors
Copyright: Institute of Software, Chinese Academy of Sciences Beijing ICP No. 05046678-4
Address：4# South Fourth Street, Zhong Guan Cun, Beijing 100190,Postal Code：100190
Phone：010-62562563 Fax：010-62562533 Email：jos@iscas.ac.cn
Technical Support：Beijing Qinyun Technology Development Co., Ltd.

Beijing Public Network Security No. 11040202500063