Defect detection generally includes two stages: static analysis and defect inspection. A large number of defects reported may lead developers and managers to reject the use of static analysis tools as part of the development process due to the overhead of defect inspection. To help with the inspection tasks, this paper formally introduces defect correlation, a sound dependency relationship between defects. If the occurrence of one defect causes another defect to occur, the two defects are correlated. This paper presents a sound optimized method to static analysis that can classify the defects reported by static defect detection tool into different groups, in which all defects are false positives (true positives) if the dominant defect is false positives (true positives). The experimental results show a decrease of 22% the time inspecting all defects and the capability and flexibility of this method to detect defects of large, critical or embedded systems.