组合测试:原理与方法
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Supported by the National Natural Science Foundation of China under Grant Nos.60673044, 60633010 (国家自然科学基金)


Combinatorial Testing: Principles and Methods
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    摘要:

    组合测试能够在保证错误检出率的前提下采用较少的测试用例测试系统.但是,组合测试用例集的构造问题的复杂度是NP完全的.组合测试方法的有效性和复杂性吸引了组合数学领域和软件工程领域的学者们对其进行深入的研究.总结了近年来在组合测试方面的研究进展,主要内容包括:组合测试准则的研究、组合测试生成问题与其他NP完全问题的联系、组合测试用例的数学构造方法、采用计算机搜索的组合测试生成方法以及基于组合测试的错误定位技术.

    Abstract:

    Combinatorial testing can use a small number of test cases to test systems while preserving fault detection ability. However, the complexity of test case generation problem for combinatorial testing is NP-complete. The efficiency and complexity of this testing method have attracted many researchers from the area of combinatorics and software engineering. This paper summarizes the research works on this topic in recent years. They include: various combinatorial test criteria, the relations between the test generation problem and other NP-complete problems, the mathematical methods for constructing test cases, the computer search techniques for test generation and fault localization techniques based on combinatorial testing.

    参考文献
    [1] Kuhn DR, Reilly MJ. An investigation of the applicability of design of experiments to software testing. In: Caulfield M, ed. Proc. of the Annual NASA/IEEE Software Engineering Workshop (SEW). Los Alamitos: IEEE Press, 2002. 91?95.
    [2] Godbole AP, Skipper DE, Sunley RA. t-Covering arrays: Upper bounds and Poisson approximations. Combinatorics, Probability and Computing, 1996,5:105?118.
    [3] Kuhn R, Lei Y, Kacker R. Practical combinatorial testing: Beyond pairwise. IT Professional, 2008,10(3):19?23.
    [4] Grindal M. Handling combinatorial explosion in software testing [Ph.D. Thesis]. Link?pings Universitet, 2007.
    [5] Cohen MB, Gibbons PB, Mugridge WB, Colbourn CJ. Constructing test suites for interaction testing. In: Dillon L, Tichy W, eds. Proc. of the Int’l Conf. on Software Engineering (ICSE). Loa Alamitos: IEEE Press, 2003. 38?48.
    [6] Nie CH, Xu BW, Shi L. A new pairwise covering test data generation algorithm for the system with many 2-level factors. Chinese Journal of Computers, 2006,29(6):841?848 (in Chinese with English abstract).
    [7] Colbourn CJ. CA tables for t= 2,3,4,5,6. 2009. http://www.public.asu.edu/~ccolbou/src/tabby/catable.html
    [8] Seroussi G, Bshouty NH. Vector sets for exhaustive testing of logical circuits. IEEE Trans. on Information Theory, 1988,34(3): 513?522.
    [9] Lei Y, Tai KC. In-Parameter-Order: A test generation strategy for pairwise testing. In: Tsai J, Keefe T, Stewart D, eds. Proc. of the IEEE Int’l. Symp. on High Assurance Systems Engineering. Los Alamitos: IEEE Press, 1998. 254?261.
    [10] Dalal SR, Jain A, Karunanithi N, Leaton JM, Lott CM, Patton GC, Horowitz BM. Model-Based testing in practice. In: Boehm B, Garlan D, Kramer J, eds. Proc. of the Int’l Conf. on Software Engineering (ICSE). New York: ACM Press, 1999. 285?294.
    [11] Cohen DM, Dalal SR, Fredman ML, Patton G. The AETG system: An approach to testing based on combinatorial design. IEEE Trans. on Software Engineering, 1997,23(7):437?443.
    [12] Czerwonka J. Pairwise testing in real world: Practical extensions to test case generators. In: Butt D, Gens C, eds. Proc. of the 24th Pacific Northwest Software Quality Conf. 2006. http://www.pnsqc.org/proceedings/pnsqc2006.pdf
    [13] Cohen MB, Gibbons PB, Mugridge WB, Colbourn CJ. Variable strength interaction testing of components. In: Bae D, Voas J, eds. Proc. of the IEEE Annual Int’l Computer Software and Applications Conf. (COMPSAC). Los Alamitos: IEEE Press, 2003. 413?418.
    [14] Schroeder PJ, Korel B. Black-Box test reduction using input-output analysis. In: Harold MJ, ed. Proc. of the Int’l Symp. on Software Testing and Analysis (ISSTA). New York: ACM Press, 2000. 173?177.
    [15] Cheng C, Dumitrescu A, Schroeder PJ. Generating small combinatorial test suites to cover input-output relationships. In: Lin H, Ehrich HD, eds. Proc. of the 3rd Int’l Conf. on Quality Software (QSIC). Los Alamitos: IEEE Press, 2003. 76?82.
    [16] Wang ZY, Nie CH, Xu BW, Shi L. Optimal test suite generation methods for neighbor factors combinatorial testing. Chinese Journal of Computers, 2007,30(2):200?211 (in Chinese with English abstract).
    [17] Wang ZY, Nie CH, Xu BW. Generating combinatorial test suite for interaction relationship. In: Pezzè M, ed. Proc. of the 4th Int’l Workshop on Software Quality Assurance (SOQUA 2007). New York: ACM Press, 2007. 55?61.
    [18] Sloane NJA. A library of orthogonal arrays. http://www.research.att.com/~njas/oadir/index.html
    [19] Yan J, Zhang J. A backtracking search tool for constructing combinatorial test suites. The Journal of Systems and Software, 2008, 81(10):1681?1693.
    [20] Ma F, Zhang J. Finding orthogonal arrays using satisfiability checkers and symmetry breaking constraints. In: Ho TB, Zhou ZH, eds. Proc. of the 10th Pacific Rim Int’l Conf. on Artificial Intelligence (PRICAI 2008). LNAI 5351, Berlin/Heidelberg: Springer-Verlag, 2008. 247?259.
    [21] Chateauneuf M, Kreher D. On the state of strength-three covering arrays. Journal of Combinatorial Designs, 2002,10(4):217?238.
    [22] Williams AW, Probert RL. A practical strategy for testing pair-wise coverage of network interfaces. In: Lyu MR, ed. Proc. of the 7th Int’l Symp. on Software Reliability Engineering (ISSRE). Los Alamitos: IEEE Press, 1996. 246?254.
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严俊,张健.组合测试:原理与方法.软件学报,2009,20(6):1393-1405

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  • 收稿日期:2008-05-16
  • 最后修改日期:2008-10-07
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